High Quality Test Pattern Generation And Boolean Satisfiability

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High Quality Test Pattern Generation And Boolean Satisfiability

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High Quality Test Pattern Generation And Boolean Satisfiability

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High Quality Test Pattern Generation And Boolean Satisfiability

Part I: Preliminaries And Previous Work.- Circuits And Testing.- Boolean Satisfiability.- Atpg Based On Boolean Satisfiability.- Part Ii: Sat Techniques And Their Application In Atpg.- Dynamic Clause Activation.- Circuit-based Dynamic Learning.- Part Iii: High Quality Delay Test Generation.- High Quality Atpg For Transition Faults.- Path Delay Fault Model.- Summary And Outlook.
  • Brand: Springer Nature B.V
  • Category: Computing & Internet
  • Format: Paperback
  • Language: English
  • Publication Date: 2014-10-20
  • Publisher / Label: Springer Nature B.V
  • Author: Stephan Eggersgl
  • Number of Pages: 212
  • Fruugo ID: 557057426-1125325917
  • ISBN: 9781489988478
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